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SENIOR/STAFF ENGINEER, TEST SOLUTIONS ENGINEERING

Micron Technology · SG

SG · On-siteFull-TimePosted Jun 16, 2026

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Job description

Our vision is to transform how the world uses information to enrich life for all.

Join an inclusive team passionate about one thing: using their expertise in the relentless pursuit of innovation for customers and partners. The solutions we build help make everything from virtual reality experiences to breakthroughs in neural networks possible. We do it all while committing to integrity, sustainability, and giving back to our communities. Because doing so can fuel the very innovation we are pursuing.

Job Description

As a Senior/Staff Test Solutions Engineer (HBM Probe) at Micron, you will take full ownership of developing, debugging, and delivering wafer/cube probe test solutions for High Bandwidth Memory (HBM) devices across the product lifecycle—from new product introduction (NPI) through high-volume manufacturing (HVM).

You are expected to drive fast learning cycles during early silicon, ensure probe readiness for downstream processes, and deliver test solutions that meet aggressive targets on yield, quality, and cost. This role requires strong accountability in problem-solving, decision-making, and execution, working across global cross-functional teams to drive outcomes.

Job Responsibilities

HBM Probe Test Development & Ownership

  • Own end-to-end development and delivery of wafer/cube probe test solutions for HBM devices
  • Define and drive probe test plans, including coverage strategy, defect screening, and test time targets
  • Develop, debug, and release ATE test programs with full accountability for quality and manufacturability Ensure test solutions are robust, scalable, and aligned to NPI and production requirements

Silicon Debug & Root Cause Closure

  • Take ownership of complex wafer/cube probe failures and drive deep debug across silicon, test program, and hardware domains
  • Lead root cause analysis using data, failure signatures, and cross-domain insights (Design, DFT, Process, Test) Drive end-to-end issue closure, ensuring corrective actions are validated and sustained in production

Data Analysis, Yield & Learning Acceleration

  • Own probe data analysis to identify yield gaps, parametric shifts, and defect mechanisms
  • Drive fast learning cycles by converting probe insights into actionable improvements for downstream processes Make data-driven decisions to optimize test coverage, guardbands, and release readiness

NPI Execution & Production Readiness

  • Own probe bring-up for first silicon and drive readiness for characterization and qualification
  • Ensure smooth transition of probe solutions into downstream flows and high-volume manufacturing Proactively identify risks and gaps and drive mitigation plans to meet program milestones

Probe Hardware & System Accountability

  • Own interaction between probe test programs and hardware (probe cards, load boards, probers)
  • Drive resolution of hardware-software interaction issues impacting stability, accuracy, and throughput Ensure probe setups are optimized and validated for both engineering and production usage

Cost, Test Time & Efficiency Delivery

  • Take ownership of probe test time and cost targets, driving continuous optimization without compromising quality
  • Balance coverage vs. efficiency trade-offs and make decisions aligned to product and business needs Identify and implement innovations to improve probe productivity and cost effectiveness

Cross-Functional Leadership

  • Drive alignment across Design, DFT, Product Engineering, and Manufacturing to resolve probe-related challenges
  • Influence early design and testability decisions to improve overall product quality and test efficiency Act as a key technical point of contact, ensuring clear communication and decisive execution across global teams

Technical Leadership & Capability Building

  • Mentor engineers and elevate team capability in probe test development, debug methodologies, and data a

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